Thermal oxide Layer

• SiO2 layer on Silicon wafer
• Oxide layer thickness: 100 nm   ( 1000A)  +/-10%
• Refractive index - 1.455

Silicon Wafer Specifications:

• Conductive type:          N-type/ As-dped 
• Resistivity:                  0.001-0.005 ohm.cm   (If you would like to measure the resistivity accurately, 
                                     please order our Portable 4 Probe Resistivity Testing Instrument.) 
• Size:                           10 x 10 x 0.5 mm
• Orientation:                 (100) +/- 1^o
• Polish:                        one side polished
• Surface roughness, Ra: < 5A (RMS)

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