In-Situ Thin Film Thickness / Deposition Rate Monitor with Software, and Optional Sensor, Quartz Crystals - TM106-LD
In-Situ Thin Film Thickness / Deposition Rate Monitor with Software, and Optional Sensor, Quartz Crystals - TM106-LD
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$3,896.00 USD
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$3,896.00 USD
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SKU: : \TM106-LD
EQ-TM106-LD is a high precision thickness sensor/monitor for the thin film deposition process. It is based on the principle that the mass of a deposited film on a quartz crystal can be measured by monitoring the change in crystal’s oscillating frequency. If the density of deposited material is known, the thickness can be determined to a high resolution of sub-Angstrom (0.037 Å for this equipment).
SPECIFICATIONS:
LIST OF PARTS:
SPECIFICATIONS:
Power |
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Frequency Range |
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Frequency Resolution |
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Measurement Speed |
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Reference Frequency Stability |
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Thickness and Rate Resolution |
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Display Resolution |
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Operating Temperature |
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Water Flow Requirement |
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Water Feedthrough |
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Standard Package |
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Quartz Crystals (Optional)
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Operating System |
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Software |
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Installation | |||||||||
Compliance | CE Certificated (Assembled in the USA) | ||||||||
Production Dimensions |
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Monitor Weight |
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Warranty |
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Operation Instructions | |||||||||
Application Notes |
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LIST OF PARTS:
No. | Description | Qty |
1 |
STM-2 rate / thickness monitor | 1 |
2 |
Software/monitor manual CD |
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Manufacturer Part Number: